devoir

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DEVOIR. Duty. It is used in the statute of 2 Ric. II., c. 3, in the sense of duties or customs.

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With a known stimulus and multiple receivers, the VNA can accurately measure the complex impedance and transmission characteristics of a DUT.

Stepping up to a vector network analyzer for IoT design optimization

Third, different DUTs result indifferent probe impedances, raising difficulties for analysis; there are fewer effects on the impedance of a CPW feed-line when the medium or the dielectric constant is different [23], and potentially less error when the DUT or the medium between the loop and feed-line is different.

Novel non-direct contacting measurement using signal transfer model extraction and vertical coupling method

The physical meaning of (7) is following: the DUT model is built with series and parallel connected networks.

Critical model components and their fingerprint features in the simulated conducted radio frequency immunity of complex integrated circuits

3DUT] are the powers measured at port 2 using the DUT and that at port 3 using a monitoring sensor, respectively,

Direct comparison transfer of microwave power sensor calibration with an adaptor: modeling and evaluation

The fundamental system RC time constant is determined by device impedance (R) and cable capacitance (C), and the AC stimulus cannot be applied to the DUT at a frequency faster than this time constant.

Turn down the noise: modifying conventional differential conductance techniques improves speed and accuracy while reducing noise

It is important to simulate the extracted DUT model and ensure correlation between simulation and measurement data.

PBGA package lead modeling using TDR and IConnect: accurate modeling of package inner structures aids high-speed system-level simulations

DUT noise amplification is an obvious choice to bring it several decibels above the instrument noise floor.

Theory and practical considerations for measuring phase noise better than -165 dBc/Hz: Part I

If Zin on the DUT is large (typical of a logic gate input), the current Idrv will be small, and little voltage will develop across Ldrv due to ground bounce.

Avoiding board bounce: addressing root causes of digital noise and test instability

When the DUT is under heavy load conditions, a random set of events can be generated.

The MPLS test approach

We can assess the contributions to the relative combined standard uncertainty of the DUT responsivity by evaluating the uncertainties of the quantities given in Eq.

Improved Near-Infrared Spectral Responsivity Scale

The R&S NRPM OTA power measurement solution from Rohde & Schwarz now allows users to measure and calibrate the output power of a DUT as well as test its beamforming function ?

Germany : Rohde & Schwarz presents the first over-the-air power measurement solution for 5G and wireless gigabit components

In applications like nanotechnology and semiconductor research, the generated current may exceed the current to be measured from the DUT.